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International Journal of Nanomaterials and Chemistry
An International Journal
               
 
 
 
 
 
 
 
 
 
 
 
 

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Volumes > Volume 9 > No.1

 
   

On Approach to Increase Integration Rate of Complementary Gate Overlap Field-Effect Heterotransistors in the Framework of a Double Tail Comparator

PP: 1-12
doi:10.18576/ijnc/090101        
Author(s)
Evgeny L. Pankratov,
Abstract
In this paper we introduce an approach to increase integration rate of complementary gate overlap field-effect heterotransistors framework a double tail comparator. In the framework of the approach we consider a heterostructure with special configuration. Several specific areas of the heterostructure should be doped by diffusion or ion implantation. Annealing of dopant and/or radiation defects should be optimized.

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